14/09/2015
School of Scanning Electron Microscopy
Registration to the School has been extended to September 27th
Alta Tecnologia
12-14 October 2015 – Trieste
The school, jointly organized by SISM and CNR-IOM, aims to provide the concepts and basic physical principles of scanning electron microscopy and microanalysis with a special focus on nanostructured materials and innovative applications. The school is addressed to researchers, technicians and students both from academia and industry who wish to acquire the skills necessary for the proper use of scanning electron microscopy and related analytical techniques.
Eminent Scientists from Universities and Research Institutions will share their knowledge and experience in the form of lectures providing the basic physical principles of scanning electron microscopy and related analytical techniques available in a modern scanning electron microscope. Practical sessions as well as a demonstration-tour at the CNR-IOM laboratory facilities will also be included to investigate different types of nanostructured materials and to highlight performances, differences and fields of applications.
Emphasis will be also paid on current trends and technologies for industrial applications from device nanofabrication by electron beam lithography and Focused Ion beam technology to characterization and failure analysis as well as in-situ electrical and mechanical probing.