Structural analysis techniques
X-ray diffraction (XRD)
This is a non-destructive technique used to determine the structure of materials, especially those that are inorganic, crystallized, and in a solid state. CNR-IOM’s X-ray diffractomer was designed to allow for the X-ray diffraction analysis of a wide array of materials ranging from micrometric powders to thin films and/or nano-engineering heterostructures through the use of specific modules that optimize their experimental configuration.
Thanks to synchrotron light it is also possible to:
- Analyze the structure of crystal-like materials by collecting information on their formation, growth, microscopic structure, macroscopic aspect, and physical properties
- Identify the phases of amorphous materials
- Study the structure of proteins and molecules
SOME EXAMPLES OF APPLICATIONS