Structural analysis techniques

X-ray diffraction (XRD)

This is a non-destructive technique used to determine the structure of materials, especially those that are inorganic, crystallized, and in a solid state. CNR-IOM’s X-ray diffractomer was designed to allow for the X-ray diffraction analysis of a wide array of materials ranging from micrometric powders to thin films and/or nano-engineering heterostructures through the use of specific modules that optimize their experimental configuration.

Thanks to synchrotron light it is also possible to:

  • Analyze the structure of crystal-like materials by collecting information on their formation, growth, microscopic structure, macroscopic aspect, and physical properties
  • Identify the phases of amorphous materials
  • Study the structure of proteins and molecules


SOME EXAMPLES OF APPLICATIONS